3D Sequential Integration: Application-driven technological achievements and guidelines

Autor: C. Comboroure, M. Zussy, L. Pasini, N. Rambal, J.-B. Pin, François Martin, V. Balan, Perrine Batude, C. Vizioz, J.M. Hartmann, Virginie Loup, N. Allouti, Sébastien Barnola, A. Duboust, Frédéric Mazen, O. Faynot, Louis Hutin, Mazzocchi, R. Berthelon, A. Ayres, Gilles Sicard, F. Deprat, Sebastien Hentz, J.-P. Colinge, Francois Andrieu, B. Mathieu, S. Beaurepaire, J. Micout, F. Ponthenier, E. Vianello, F. Fournel, O. Rozeau, E. Avelar Mercado, V. Ripoche, V. Beugin, Cristiano Santos, M.-P. Samson, Pascal Vivet, D. Larmagnac, S. Barraud, C. Euvrard-Colnat, Sebastien Kerdiles, M. Vinet, Benoit Sklenard, P. Acosta Alba, Sebastien Thuries, C. Fenouillet-Beranger, Philippe Rodriguez, X. Garros, Fabrice Nemouchi, R. Gassilloud, O. Billoint, Julien Arcamone, Pascal Besson, Didier Lattard, M. Casse, Laurent Brunet, C.-M. V. Lu, Bernard Previtali
Jazyk: angličtina
Předmět:
Zdroj: 2017 IEEE International Electron Devices Meeting (IEDM)
DOI: 10.1109/iedm.2017.8268316
Popis: 3D Sequential Integration (3DSI) with ultra-small 3D contact pitch (
Databáze: OpenAIRE