| Autor: |
Šimunović, Vedran, Baršić, Gorana |
| Rok vydání: |
2023 |
| Předmět: |
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| Zdroj: |
Proceedings of the IMEKO TC11 Conference on Measurement in Testing, Inspection and Certification. |
| DOI: |
10.21014/tc11-2022.07 |
| Popis: |
Measurement devices for form and roughness use the measurement probe that converts the displacement into an electrical signal. In addition to the form/roughness information, the measurement signal can contain undesirable noise due to mechanical, electrical, thermal, and other influences that can lead to an error in the measurement result. Given the growing demands to reduce measurement uncertainty, especially in the form and roughness measurement, noise is found to be a limiting factor. In 2019 the EMPIR project entitled Traceability for contact probe and stylus instrument measurements (18PRT01 ProbeTrace) was launched. The overall goal of this project is to develop traceable and cost-effective measurement capabilities for the calibration of form and surface roughness standards with uncertainties in the range of 10 nm to 100 nm. To achieve targeted uncertainties noise reduction software with numerical methods for random noise bias reduction must be developed to be used to pre-process roughness and form profile data. The novel method that will be investigated in the ProbeTrace project is based on Random Noise Bias Removal where only a few repeated measurements are needed to obtain unbiased results. Software based on random noise bias reduction will be presented in this paper along with the results of applied noise reduction to roundness measurement data in the Croatian National Laboratory for Length (FSB). |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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