A stochastic evaluation of the contour strength

Autor: Fernand Meyer, Jean Stawiaski
Přispěvatelé: Centre de Morphologie Mathématique (CMM), MINES ParisTech - École nationale supérieure des mines de Paris, Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL), MedisysResearch Lab (Medisys), Philips Research, Goesele, M., Roth, S., Kuijper, A., Schiele, B., Schindler, K.
Jazyk: angličtina
Rok vydání: 2010
Předmět:
Zdroj: Pattern Recognition, Proceedings of the 32nd DAGM Symposium, Darmstadt, Germany, 2010
32nd Annual Symposium of the German Association for Pattern Recognition (DAGM 2010)
32nd Annual Symposium of the German Association for Pattern Recognition (DAGM 2010), Sep 2010, Darmstadt, Germany. pp.513-522, ⟨10.1007/978-3-642-15986-2_52⟩
Lecture Notes in Computer Science ISBN: 9783642159855
DAGM-Symposium
DOI: 10.1007/978-3-642-15986-2_52⟩
Popis: International audience; If one considers only local neighborhoods for segmenting an image, one gets contours whose strength is often poorly estimated. A method for reevaluating the contour strength by taking into account non local features is presented: one generates a fixed number of random germs which serve as markers for the watershed segmentation. For each new population of markers, another set of contours is generated. "Important" contours are selected more often. The present paper shows that the probability that a contour is selected can be estimated without performing the effective simulations. Copyright Springer-Verlag 2010. The original publication is available at www.springerlink.com/content/y057x103475301r2/
Databáze: OpenAIRE