Measurement Of Quasiparticle Transport In Aluminum Films Using Tungsten Transition-Edge Sensors
Autor: | Betty A. Young, M. Cherry, Astrid Tomada, B. Shank, J. J. Yen, E. C. Tortorici, Blas Cabrera, John Mark Kreikebaum, P. L. Brink, P. Redl, Robert A. Moffatt |
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Rok vydání: | 2014 |
Předmět: |
010302 applied physics
Molecular diffusion Physics - Instrumentation and Detectors Materials science Physics and Astronomy (miscellaneous) Condensed matter physics Phonon chemistry.chemical_element FOS: Physical sciences Instrumentation and Detectors (physics.ins-det) Tungsten 01 natural sciences Pulse (physics) Condensed Matter::Materials Science chemistry Aluminium Condensed Matter::Superconductivity 0103 physical sciences Quasiparticle Diffusion (business) 010306 general physics Transition edge |
DOI: | 10.48550/arxiv.1406.7308 |
Popis: | We report new experimental studies to understand the physics of phonon sensors which utilize quasiparticle diffusion in thin aluminum films into tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al films in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al films using a simple diffusion equation approach. Comment: 5 pages, 6 figures, PRAL |
Databáze: | OpenAIRE |
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