Solar cell imaging and characterization by terahertz techniques
| Autor: | Irmantas Kašalynas, S. Balakauskas, Linas Minkevičius, Gintaras Valušis, Rasa Suzanovičienė, Arūnas Krotkus, Vincas Tamošiūnas, G. Molis, R. Venckevicius, Dalius Seliuta |
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| Rok vydání: | 2012 |
| Předmět: |
Materials science
Silicon business.industry Terahertz radiation Doping chemistry.chemical_element Characterization (materials science) law.invention Optics chemistry law Solar cell Reflection (physics) Optoelectronics Continuous wave Material Studies New Concepts and Ultra-High Efficiency Plasmonic solar cell business Fundamental Material Studies |
| Zdroj: | SPIE Proceedings. |
| ISSN: | 0277-786X |
| Popis: | 27th European Photovoltaic Solar Energy Conference and Exhibition; 520-523 We present our investigations of solar cells and related structures by means of THz imaging. Both continuous wave and pulsed THz imaging set-ups were employed for identification of possible technological defects in various steps of production in a contactless way. We demonstrate that THz imaging can be employed for detecting manufacturing defects of solder tabs, discontinuities of metal fingers, cracks or different reflection coefficients for structured and unstructured surfaces. Continuous wave THz imaging was used to verify the transparence of Cu(In,Ga)Se2 layers in this range for the future work on full 3D characterization of these thin film solar cells. Fourier transform infrared spectroscopy was applied to demonstrate reflectivity variations of CuInS2 films. |
| Databáze: | OpenAIRE |
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