Avalanche Photodiodes with Dual Multiplication Layers for High-Speed and Wide Dynamic Range Performances
Autor: | Hung Shiang Chen, Emin Chou, Sheng Yun Wang, Yi Shan Lee, Naseem, Jack Jia Sheng Huang, Yu Heng Jan, Zohauddin Ahmad, Sean Yang, Po Shun Wang, Yan Min Liao, Hsiang Szu Chang, Rui Lin Chao, Jin-Wei Shi |
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Jazyk: | angličtina |
Rok vydání: | 2021 |
Předmět: |
lcsh:Applied optics. Photonics
Materials science business.industry lcsh:TA1501-1820 Optical modulation amplitude Avalanche photodiode Atomic and Molecular Physics and Optics avalanche photodiode Photodiode law.invention Responsivity Saturation current law Wide dynamic range Bandwidth (computing) Optoelectronics Radiology Nuclear Medicine and imaging photodiode photodetector business Instrumentation Gain–bandwidth product |
Zdroj: | Photonics, Vol 8, Iss 98, p 98 (2021) Photonics Volume 8 Issue 4 |
ISSN: | 2304-6732 |
Popis: | In this work, we demonstrate In0.52Al0.48As top/backside-illuminated avalanche photodiodes (APD) with dual multiplication layers for high-speed and wide dynamic range performances. Our fabricated top-illuminated APDs, with a partially depleted p-type In0.53Ga0.47As absorber layer and thin In0.52Al0.48As dual multiplication (M-) layer (60 and 88 nm), exhibit a wide optical-to-electrical bandwidth (16 GHz) with high responsivity (2.5 A/W) under strong light illumination (around 1 mW). The measured bias dependent 3-dB O-E bandwidth was pinned at 16 GHz without any serious degradation near the saturation current output. To further increase the speed, we downscaled the active diameter and adopted a back-side illuminated structure with flip-chip bonding for batter optical alignment tolerance. A significant improvement in maximum bandwidth was demonstrated (25 versus 18 GHz). On the other hand, we adopted a thick dual M-layer (200 and 300 nm) and 2 μm absorber layer in the APD design to circumvent the problem of serious bandwidth degradation under high gain (> 100) and high-power operation which significantly enhanced the dynamic range. Due to dual M-layer, the carriers could be energized in the first M-layer then propagate to the second M-layer to trigger the avalanche process. In both cases, despite variation in thickness of the absorber and M-layer, the cascade avalanche process leads to values close to the ultra-high gain bandwidth product (GBP) of around 460 GHz with a responsivity of 0.4 and 1 A/W at unit gain for the thin and thick M-layer devices, respectively. We successfully achieved a good sensitivity of around −20.6 dBm optical modulation amplitude (OMA) at a data rate of 25.78 Gb/s, by packaging the fabricated APDs (thin dual M-layer (60 and 88 nm) version) with a 25 Gb/s trans-impedance amplifier in a 100 Gb/s ROSA package. The results show that, the incorporation of a dual multiplication (M) layer structure in the APD opens a new window to obtaining the higher GBP in order to meet the requirements for high-speed transmission without the need of further downscaling the multiplication layer. |
Databáze: | OpenAIRE |
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