Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering
| Autor: | A. N. Dobrynin, D. N. Ievlev, Wim Bras, C. Hendrich, E. Piscopiello, Kristiaan Temst, Peter Lievens, U. Hörmann, Luc Favre, G. Van Tendeloo |
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| Přispěvatelé: | Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), European Synchrotron Radiation Facility (ESRF), Electron Microscopy for Material Resaerch (EMAT) (EMAT), University of Antwerp (UA), Laboratory of Solid State Physics and Magnetism and INPAC, Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2007 |
| Předmět: |
Small-angle X-ray scattering
Scattering Chemistry Evaporation Analytical chemistry 02 engineering and technology General Chemistry Substrate (electronics) 021001 nanoscience & nanotechnology Mass spectrometry 01 natural sciences Transmission electron microscopy 0103 physical sciences Mass spectrum Cluster (physics) [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] General Materials Science [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics 010306 general physics 0210 nano-technology ComputingMilieux_MISCELLANEOUS |
| Zdroj: | Applied physics. A, Materials science & processing Applied physics. A, Materials science & processing, Springer Verlag, 2007, 86 (4), pp.533-538. ⟨10.1007/s00339-006-3808-5⟩ Applied physics A: materials science & processing Applied physics. A, Materials science & processing, 2007, 86 (4), pp.533-538. ⟨10.1007/s00339-006-3808-5⟩ |
| ISSN: | 0947-8396 1432-0630 |
| DOI: | 10.1007/s00339-006-3808-5⟩ |
| Popis: | Ensembles of nanometer-sized Au, Co, Er, and FePt clusters were generated by a laser vaporization source and embedded in a MgO matrix grown on a mica substrate. The size distribution of the clusters was measured before sample preparation by time-of-flight mass spectrometry and afterwards by transmission electron microscopy. These well-characterized samples were used for investigations by small-angle X-ray scattering (SAXS). The scattering data was evaluated by Guinier analysis providing the average radii of the embedded clusters. The results are in good agreement with the cluster sizes obtained from the mass spectra as well as the dimensions determined from the transmission electron micrographs. Furthermore, other samples which were produced at an elevated substrate temperature of 500 °C exhibited an increased average cluster radius in the SAXS measurements. This behavior is attributed to diffusion and coalescence emerging at higher deposition temperatures. |
| Databáze: | OpenAIRE |
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