NEW DIMENSIONS IN ATOM-PROBE ANALYSIS
| Autor: | P.J. Warren, R.P. Setna, Alfred Cerezo, George Davey Smith, G. Beverini, Jonathan M. Hyde, Michael K Miller |
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| Rok vydání: | 1992 |
| Předmět: |
Field (physics)
Chemistry Analytical chemistry Phase (waves) Surfaces and Interfaces Atom probe Condensed Matter Physics Surfaces Coatings and Films law.invention Ion Computational physics Position (vector) law Atom (measure theory) Materials Chemistry Measuring instrument Sensitivity (control systems) |
| Zdroj: | SURFACE SCIENCE 38TH INTERNATIONAL FIELD EMISSION SYMP : FIELD EMISSION 91. 266(1-3) |
| ISSN: | 0039-6028 |
| Popis: | A new class of atom-probe instruments has recently been developed which combine single atom sensitivity mass spectrometry with position sensing, and have the potential of reconstructing nanometre-scale composition variations in three-dimensions. These techniques will be very powerful in the study of the early stages of phase transformations, and surface and interface segregation. Some recent results obtained with the first of these instruments, the position-sensitive atom probe, are described. Difficulties arise in this instrument when more than one ion is evaporated from the analysis area on a single field evaporation pulse, which can limit the accuracy of analysis performed on the resultant data. Other three-dimensional atom-probe instruments currently under development are described, and their expected performance in this respect is discussed. The significance of defining composition on the sub-nanometre scale is addressed, and the importance of atomic-scale modelling of the phenomena under investigation is indicated. |
| Databáze: | OpenAIRE |
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