Decomposition of Wavelength Dispersive X-Ray Spectra
| Autor: | Matthew R. Phillips, C.E. Nockolds, Guy Remond, Claude Roques-Carmes, Michel Fialin, Robert L. Myklebust |
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| Jazyk: | angličtina |
| Rok vydání: | 2002 |
| Předmět: |
Spectrum analyzer
Materials science Spectrometer General Science & Technology business.industry Astrophysics::High Energy Astrophysical Phenomena General Engineering Electron microprobe Electron pseudo-Voigt profiles Molecular physics Spectral line Article Wavelength Optics atomic lines satellites distortions induced by absorption edges WDS instrumental distortions business Absorption (electromagnetic radiation) Line (formation) soft x-ray bands |
| Zdroj: | Journal of Research of the National Institute of Standards and Technology |
| ISSN: | 2165-7254 1044-677X |
| Popis: | Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt profiles of the digitally measured spectra are used to account for the presence of non-diagram features (high and low energy satellites) and instrumental induced distortions. The effect of line width and relative intensities on the quality of fits is illustrated. Spectral distortions resulting from the presence of absorption edges within the analyzed wavelength region are illustrated for the case of FeLα,β emission bands for pure Fe and iron oxides. For quantitative analysis, an analytical approach is presented where the measured soft x-ray emission bands are corrected for self absorption before extracting the intensities from the experimental data. |
| Databáze: | OpenAIRE |
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