Characterization of MOS varactor with large signal Network Analyser (LSNA) in CMOS 65nm bulk and SOI technologies
| Autor: | Christophe Gaquiere, Damien Ducateau, J.-F. Larchanche, Yvan Morandini, Daniel Gloria |
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| Přispěvatelé: | Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF) |
| Rok vydání: | 2007 |
| Předmět: |
010302 applied physics
Signal processing Engineering business.industry 020208 electrical & electronic engineering Silicon on insulator Biasing 02 engineering and technology Condensed Matter::Mesoscopic Systems and Quantum Hall Effect 01 natural sciences Capacitance Signal Harmonic balance CMOS 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electronic engineering business Varicap |
| Zdroj: | Proceedings of the 69th ARFTG Microwave Measurement Conference Proceedings of the 69th ARFTG Microwave Measurement Conference, 2007, Honolulu, HI, United States |
| DOI: | 10.1109/arftg.2007.5456328 |
| Popis: | Here we report for the first time the non linear characterization and modeling of MOS varactor with a LSNA in bulk and SOI process. The comparison between large signal measurements and Harmonic Balance simulation using an electrical equivalent scheme based on small signal measurements validates the accuracy of the proposed model in this large signal conditions. Nevertheless, the capacitance behaviour versus biasing voltage is depending on signal power. From this, we develop a method for capacitance extraction. We highlight the difference of LSNA and small signal capacitance versus voltage revealing the deepth depletion with large signal conditions. Lastly, the parallel study between bulk and SOI process shows a difference on the capacitance induced by non linearities of the substrate capacitance with large signal analysis. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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