Quantification of pn-junction recombination in interdigitated back-contact crystalline silicon solar cells

Autor: Bas W. H. van de Loo, Ilkay Cesar, Pierpaolo Spinelli, Wilhelmus M. M. Kessels, Ard H. G. Vlooswijk
Přispěvatelé: Plasma & Materials Processing, Atomic scale processing, Processing of low-dimensional nanomaterials
Jazyk: angličtina
Rok vydání: 2017
Předmět:
Zdroj: IEEE Journal of Photovoltaics, 7(5):7962148, 1176-1183. IEEE Electron Devices Society
ISSN: 2156-3381
Popis: Interdigitated back-contact (IBC) solar cells based on diffused crystalline silicon comprise a series of pn -junctions which border at the rear surface of the wafer. In this work, it is established that the presence of these pn -junctions can induce significant additional charge-carrier recombination, which affect the conversion efficiency of IBC cells through a reduction in fill factor and open-circuit voltage. Using specialized test structures with varying length of pn -junctions per area of solar cell (i.e., with varying junction density), the magnitude of the recombination at the pn -junction was determined. For nonpassivated rear surfaces, a second-diode recombination current density per unit of junction density J 02 of ∼61 nA·junction–1·cm–1 was measured, whereas for surfaces which were passivated by either SiN $_{x}$ or Al 2O3/SiN $_{x}$ , J 02 was reduced to ∼0.4 nA·junction–1·cm–1. Therefore, passivation of defects at the rear surface was proven to be vital in reducing this characteristic recombination current. Finally, by optimizing the p - and n -type dopant diffusion process recipes, J 02 recombination could be suppressed. The improved doping recipes led to an increase in conversion efficiency of industrial “mercury” IBC solar cells by ∼1% absolute.
Databáze: OpenAIRE