Additional file 1 of Genome-wide association study reveals the genetic basis of yield- and quality-related traits in wheat
| Autor: | Gao, Le, Chengsheng Meng, Tengfei Yi, Xu, Ke, Huiwen Cao, Shuhua Zhang, Yang, Xueju, Zhao, Yong |
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| Rok vydání: | 2021 |
| DOI: | 10.6084/m9.figshare.14252292 |
| Popis: | Additional file 1: Fig. S1 Manhattan plots of GWAS results (BLUP values) excluding SNS, FD and GV traits. The horizontal line represents the significance threshold (−log10P = 4.05). |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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