Surface coupling effects on the capacitance of thin insulating films
| Autor: | Tayeb Jamali, George Palasantzas, Gholamreza Jafari, Mona Jannesar, S. Vasheghani Farahani |
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| Přispěvatelé: | Nanostructured Materials and Interfaces, Nanotechnology and Biophysics in Medicine (NANOBIOMED) |
| Rok vydání: | 2015 |
| Předmět: |
Surface (mathematics)
ETCHED GLASS SURFACES SURFACE/INTERFACE-ROUGHNESS Materials science Series (mathematics) Condensed matter physics Statistical Mechanics (cond-mat.stat-mech) General Physics and Astronomy FOS: Physical sciences Capacitance TRANSPORT law.invention Coupling (electronics) Capacitor SIZE Coupling effect law Roughness exponent Surface roughness SCATTERING GROWTH METALLIC-FILMS CONDUCTIVITY Condensed Matter - Statistical Mechanics |
| Zdroj: | Journal of Applied Physics, 117(17):175308, 175308-1-175308-6. AMER INST PHYSICS |
| ISSN: | 0021-8979 |
| DOI: | 10.48550/arxiv.1505.00751 |
| Popis: | A general form for the surface roughness effects on the capacitance of a capacitor is proposed. We state that a capacitor with two uncoupled rough surfaces could be treated as two capacitors in series which have been divided from the mother capacitor by a slit. This is in contrast to the case where the two rough surfaces are coupled. When the rough surfaces are coupled, the type of coupling decides the modification of the capacitance in comparison to the uncoupled case. It is shown that if the coupling between the two surfaces of the capacitor is positive (negative), the capacitance is less (higher) than the case of two uncoupled rough plates. Also, we state that when the correlation length and the roughness exponent are small, the coupling effect is not negligible. |
| Databáze: | OpenAIRE |
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