A Photovoltaic Module Diagnostic Setup for Lock-in Electroluminescence Imaging
| Autor: | Dezso Sera, Claire Mantel, Jan Vedde, Harsh Parikh, Kenn H. B. Frederiksen, Michael Larsen, Soren Forchhammer, Gisele Alves dos Reis Benatto, Peter Behrensdorff Poulsen, Sergiu Spataru |
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| Rok vydání: | 2019 |
| Předmět: |
Time delay and integration
Lock-in measurement procedure Computer science business.industry Noise (signal processing) Perspective distortion Frame (networking) Photovoltaic system Ambient noise level 0211 other engineering and technologies 02 engineering and technology 020401 chemical engineering Lock-in technique Thermography Electronic engineering System integration SDG 7 - Affordable and Clean Energy System delays 021108 energy EL imaging 0204 chemical engineering business |
| Zdroj: | Parikh, H R, Spataru, S V, Séra, D, A. dos Reis Benatto, G, Poulsen, P, Mantel, C, Forchhammer, S, Larsen, M, Frederiksen, K H B & Vedde, J 2019, A Photovoltaic Module Diagnostic Setup for Lock-in Electroluminescence Imaging . in Proceedings of 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) ., 0160-8371, IEEE Press, I E E E Photovoltaic Specialists Conference. Conference Record, pp. 0538-0543, 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), Chicago, United States, 16/06/2019 . https://doi.org/10.1109/PVSC40753.2019.8981255 Parikh, H R, Spataru, S V, Séra, D, Mantel, C, A. dos Reis Benatto, G, Poulsen, P, Frederiksen, K H B, Forchhammer, S & Vedde, J 2020, A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging . in Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46) . IEEE, 2019 IEEE 46th Photovoltaic Specialists Conference, Chicago, Illinois, United States, 16/06/2019 . https://doi.org/10.1109/PVSC40753.2019.8981255 |
| ISSN: | 0160-8371 |
| DOI: | 10.1109/pvsc40753.2019.8981255 |
| Popis: | Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of photovoltaic modules in solar industry application. We propose a diagnostic setup, which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1µs) and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise for developing new light noise removal methods, rotation of panel frame in 3 axes plane for developing perspective distortion correction techniques. The paper also gives an insight of different system and communication delays that affects the performance of overall EL lock-in imaging system integration. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging, which can also be useful for aerial drone imaging of PV plants. |
| Databáze: | OpenAIRE |
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