Polarized high-brilliance and high-resolution soft x-ray source at ELETTRA: The performance of beamline BACH
| Autor: | Daniele Cocco, Fulvio Parmigiani, R. Rochow, Marco Zangrando, Marco Finazzi, Michele Zacchigna |
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| Rok vydání: | 2004 |
| Předmět: | |
| Zdroj: | Review of Scientific Instruments. 75:31-36 |
| ISSN: | 1089-7623 0034-6748 |
| DOI: | 10.1063/1.1634355 |
| Popis: | BACH, a soft x-ray beamline for polarization-dependent experiments at the Italian synchrotron radiation facility ELETTRA, was recently completed and characterized. Its performance, in terms of energy resolution, flux and polarization, is presented. Based on two APPLE II undulators, BACH covers the energy range between 35 and 1600 eV with the control of the light polarization. The monochromator is equipped with four gratings and allows one to work either in a high resolution or in a high flux mode. After the monochromator, the beamline is split into two branches with different refocusing properties. One is optimized to exploit the performance of the soft x-ray spectrometer (ComIXS) available at the beamline. Resolving powers between 12000 at 90 eV photon energy and 6600 near 867 eV were achieved using the high-resolution gratings and the smallest available slit width (10 μm). For the high-brilliance grating, which works between 290 and 1600 eV, resolving powers between 7000 at 400 eV and 2200 at 867 eV wer... |
| Databáze: | OpenAIRE |
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