Dynamic performance of microelectromechanical systems deformable mirrors for use in an active/adaptive two-photon microscope
| Autor: | Christian Chunzi Archer-Zhang, David L. Dickensheets, Christopher L. Arrasmith, Ryan D. Downey, Warren B. Foster |
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| Rok vydání: | 2016 |
| Předmět: |
Optics and Photonics
Microscope Zernike polynomials Biomedical Engineering Coma (optics) 02 engineering and technology Diagnostic Techniques Ophthalmological 01 natural sciences Deformable mirror law.invention 010309 optics Biomaterials symbols.namesake Optics law 0103 physical sciences Image Processing Computer-Assisted Stroboscopy Adaptive optics Physics Wavefront Microscopy business.industry Active optics Equipment Design Micro-Electrical-Mechanical Systems 021001 nanoscience & nanotechnology Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Spherical aberration symbols 0210 nano-technology business |
| Zdroj: | Journal of Biomedical Optics. 21:121507 |
| ISSN: | 1083-3668 |
| DOI: | 10.1117/1.jbo.21.12.121507 |
| Popis: | Active optics such as deformable mirrors can be used to control both focal depth and aberrations during scanning laser microscopy. If the focal depth can be changed dynamically during scanning, then imaging of oblique surfaces becomes possible. If aberrations can be corrected dynamically during scanning, an image can be optimized throughout the field of view. Here, we characterize the speed and dynamic precision of a Boston Micromachines Corporation Multi-DM 140 element aberration correction mirror and a Revibro Optics 4-zone focus control mirror to assess suitability for use in an active and adaptive two-photon microscope. Tests for the multi-DM include both step response and sinusoidal frequency sweeps of specific Zernike modes (defocus, spherical aberration, coma, astigmatism, and trefoil). We find wavefront error settling times for mode amplitude steps as large as 400 nm to be less than 52???s, with 3 dB frequencies ranging from 6.5 to 10 kHz. The Revibro Optics mirror was tested for step response only, with wavefront error settling time less than 80???s for defocus steps up to 3000 nm, and less than 45???s for spherical aberration steps up to 600 nm. These response speeds are sufficient for intrascan correction at scan rates typical of two-photon microscopy. |
| Databáze: | OpenAIRE |
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