Integral method for echelles covered with lossless or absorbing thin dielectric layers
| Autor: | Evgeny Popov, Bozhan Bozhkov, John Hoose, Daniel Maystre |
|---|---|
| Přispěvatelé: | Institut FRESNEL (FRESNEL), Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU) |
| Jazyk: | angličtina |
| Rok vydání: | 1999 |
| Předmět: |
Lossless compression
Diffraction Materials science business.industry Plane (geometry) Materials Science (miscellaneous) Physics::Optics Resonance 02 engineering and technology Dielectric 021001 nanoscience & nanotechnology Diffraction efficiency 01 natural sciences Industrial and Manufacturing Engineering 010309 optics Optics 0103 physical sciences Business and International Management 0210 nano-technology business Refractive index Diffraction grating |
| Zdroj: | Applied optics Applied optics, Optical Society of America, 1999, 38, pp.47-55 Applied optics, 1999, 38, pp.47-55 |
| ISSN: | 0003-6935 1539-4522 1559-128X 2155-3165 |
| Popis: | We make a generalization of the integral method in the electromagnetic theory of gratings to study diffraction by echelles covered with dielectric lossless or absorbing layers. Numerical examples are given that show that, as in the resonance domain, the diffraction efficiency is more complicated than being a simple product of lossless diffraction efficiency curves and plane surface reflectivity. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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