TOF-SIMS characterization of impurity enrichment and redistribution in solid oxide electrolysis cells during operation

Autor:	Peter Vang Hendriksen, Ragnar Kiebach, Christodoulos Chatzichristodoulou, Xiufu Sun, Ming Chen, Kion Norrman, Sune Dalgaard Ebbesen, Mogens Bjerg Mogensen
Rok vydání:	2014
Předmět:	Electrolysis Materials science Analytical chemistry Oxide Electrolyte Cermet Cathode Anode law.invention Inorganic Chemistry chemistry.chemical_compound chemistry law Impurity Yttria-stabilized zirconia
Zdroj:	Dalton Trans.. 43:14949-14958
ISSN:	1477-9234 1477-9226
DOI:	10.1039/c4dt01053a
Popis:	TOF-SIMS analyses of state-of-the-art high temperature solid oxide electrolysis cells before and after testing under different operating conditions were performed. The investigated cells consist of an yttria stabilized zirconia (YSZ) electrolyte, a La1-xSrxMnO3-δ composite anode and a Ni-YSZ cermet cathode. The surfaces and cross-sections of the cells were analyzed, and several elemental impurities like Si, Ca and Na were identified and spatially mapped and their enrichment and migration during operation is reported. With advancing operation time, the concentration of these elements, especially Na and Ca, increases. For Si, a concentration gradient is found from the gas inlet to the gas outlet. Additionally, a loss of Ni percolation in the active cathode is observed in the same area where the Si enrichment is found. Based on the obtained TOF-SIMS results, the influence of the operating conditions on degradation is discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7f6a5521c1e4e1f237fd7a4056fa10cb https://doi.org/10.1039/c4dt01053a Zobrazit plný text záznamu