| Autor: |
Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Takuji Miki, Alkis Hatzopoulos, Makoto Nagata, Erik Jan Marinissen |
| Přispěvatelé: |
Electronic Systems |
| Jazyk: |
angličtina |
| Rok vydání: |
2022 |
| Předmět: |
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| Zdroj: |
IEEE Design & Test, 39(5), 79-87. Institute of Electrical and Electronics Engineers |
| ISSN: |
2168-2356 |
| Popis: |
Editor's notes: The authors present an IR-drop-based power-domain-scenario-based test methodology along with an in-field diagnosis technique. This utilizes on-chip monitor (OCM) circuits, and the toggle patterns can be designed with test pattern generation algorithms. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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