Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope
| Autor: | Adrian J. D’Alfonso, Ayako Hashimoto, Kazutaka Mitsuishi, G. Behan, E. C. Cosgriff, Peng Wang, Angus I. Kirkland, Peter D. Nellist, Masaki Takeguchi, Masayuki Shimojo, Andrew J. Morgan, Leslie J. Allen |
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| Rok vydání: | 2011 |
| Předmět: |
Conventional transmission electron microscope
Microscopy Confocal business.industry Chemistry Scanning confocal electron microscopy Metal Nanoparticles Electrons Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Optics Microscopy Electron Transmission Electron tomography law Lens Crystalline Scanning transmission electron microscopy Microscopy Image Processing Computer-Assisted Energy filtered transmission electron microscopy Gold Electron microscope business High-resolution transmission electron microscopy Instrumentation |
| Zdroj: | Ultramicroscopy. 111:877-886 |
| ISSN: | 0304-3991 |
| DOI: | 10.1016/j.ultramic.2010.10.012 |
| Popis: | Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored. |
| Databáze: | OpenAIRE |
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