Developments for inverted atomic force microscopy
| Autor: | James C. Mabry, Hui-Wen Yap, Tim Yau, John-Bruce D. Green |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
Cantilever
Fabrication Chemistry Instrumentation Nanotechnology Epoxy Conductive atomic force microscopy Atomic and Molecular Physics and Optics Computer Science::Other Electronic Optical and Magnetic Materials Highly oriented pyrolytic graphite visual_art visual_art.visual_art_medium Mica Microfabrication |
| Zdroj: | Ultramicroscopy. 91:73-82 |
| ISSN: | 0304-3991 |
| Popis: | Atomic force microscopy (AFM) has been used to study a wide range of systems. Chemically and biologically modified probes have extended AFM by coupling chemical and biological information with the physical measurements. In an effort to further expand the capabilities of modified AFM probes, previous studies investigated the use of an inverted AFM design (i-AFM), wherein a microfabricated tip array is used to image a cantilever-supported sample. This report details developments in cantilever and tip array fabrication which are aimed at improving the applicability and performance of this i-AFM design. Using an epoxy-based procedure, commercial cantilevers were modified with a series of standard substrates, including template-stripped gold, highly oriented pyrolytic graphite, and mica. The samples on these cantilevers were imaged with i-AFM, and lateral force images are obtained. This paper demonstrates the first use of i-AFM for measuring friction. |
| Databáze: | OpenAIRE |
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