Direct observation of lateral current spreading in ridge waveguide lasers using scanning voltage microscopy

Autor:	Ban, D., Sargent, E. H., Hinzer, K., Dixon-Warren, St. J., Calder, I., Springthorpe, Anthony, White, J. K.
Rok vydání:	2003
Předmět:	Materials science Physics and Astronomy (miscellaneous) business.industry Laser Ridge (differential geometry) law.invention Semiconductor laser theory Scanning probe microscopy Optics Scanning voltage microscopy law Current (fluid) business Current density Voltage
Zdroj:	Applied Physics Letters. 82:4166-4168
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.1581982
Popis:	We report results of two-dimensional (2D) local voltage measurement of the transverse cross section of operating multiquantum-well ridge-waveguide (RWG) lasers. We observe lateral nonuniformity of local voltage in the n-cladding layers of the laser and attribute the voltage variation to 2D carrier transport effect within the RWG lasers. The quantitative evaluation of this effect indicates the local vertical current density to be ∼40% smaller at the edge of the ridge than at its center. Our results demonstrate the strength and application of scanning voltage microscopy technique in quantitatively delineating 2D current flow in operating optoelectronic devices.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7c405ee1dc4598a57e8e52d4399b82c7 https://doi.org/10.1063/1.1581982 Zobrazit plný text záznamu