Local Surface Modifications Investigated by Combining Scanning Electrochemical Microscopy and Surface-Enhanced Raman Scattering
| Autor: | Michaela Nebel, Wolfgang Schuhmann, Jan Clausmeyer, Stefanie Grützke, Yasin Ugur Kayran |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Surface (mathematics)
Materials science Self-assembled monolayer 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Electrochemistry 01 natural sciences 0104 chemical sciences Scanning electrochemical microscopy symbols.namesake Chemical engineering Monolayer Microscopy symbols 0210 nano-technology Raman scattering |
| Zdroj: | ChemPlusChem. 83:414-417 |
| ISSN: | 2192-6506 |
| Popis: | Scanning electrochemical microscopy (SECM) is coupled with surface-enhanced Raman scattering (SERS) microscopy to characterize local surface modifications. SECM is utilized for the surface patterning of para-nitrothiophenol self-assembled monolayers (SAMs) in the direct mode of SECM with a subsequent readout of the chemical patterns by means of combined SECM-SERS. The SECM-SERS combination allows monitoring of local electrochemical processes and provides simultaneous complementary spectroscopic information. The reaction products upon SAM reduction, specifically p-aminothiophenol groups, are distinguished from the pristine SAM and locally ruptured areas. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Plný text