FMR Damping in Thin Films with Exchange Bias
| Autor: | Irina L. Romashkina, A. V. Makunin, Mikhail G. Kozin, I. O. Dzhun, Georgy V. Babaytsev, N.G. Chechenin |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Materials science
02 engineering and technology 01 natural sciences Magnetization F/AF and AF/F structures FMR linewidth external damping factors internal stray field 0103 physical sciences Materials Chemistry Antiferromagnetism QD1-999 010302 applied physics Condensed matter physics Scattering Magnon Demagnetizing field 021001 nanoscience & nanotechnology Ferromagnetic resonance Electronic Optical and Magnetic Materials Chemistry Exchange bias Ferromagnetism Chemistry (miscellaneous) 0210 nano-technology |
| Zdroj: | Magnetochemistry; Volume 7; Issue 5; Pages: 70 Magnetochemistry, Vol 7, Iss 70, p 70 (2021) |
| ISSN: | 2312-7481 |
| DOI: | 10.3390/magnetochemistry7050070 |
| Popis: | Ferromagnetic resonance (FMR) linewidth (LW) is a tool for studying the high frequency properties of magnetic materials for their application in high-speed devices. Here, we investigate different mechanisms which determine FMR damping in bilayer ferromagnetic/antiferromagnetic (F/AF and AF/F) exchange bias systems. Variations of FMR LW with the thickness and deposition order of the F and AF layers were studied, as well as their correlation with the exchange bias field and roughness of the sample surface. We observed much larger LW in AF/F structures compared with F/AF samples. It was found that neither the exchange bias nor surface/interface roughness in the samples could explain the difference in LW for F/AF and AF/F samples. Instead, the different underlayer microstructure influenced the grainsize, leading to different angular dispersion of magnetization and different internal stray field in F-layers, promoting a different intensity of magnon scattering and FMR damping in F/AF and AF/F samples. |
| Databáze: | OpenAIRE |
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