Moiré–Ronchigram analysis applied in the characterization of aberration surfaces and optical surface parameters from 3D wavefronts
| Autor: | J. A. Arriaga-Hernández, J. Oliveros-Oliveros, Alberto Jaramillo-Núñez, B. Cuevas-Otahola |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Physics
Wavefront business.industry Zernike polynomials Astrophysics::Instrumentation and Methods for Astrophysics Moiré pattern 01 natural sciences Atomic and Molecular Physics and Optics 010309 optics symbols.namesake Fourier transform Optics General equation 0103 physical sciences Optical surface Moire deflectometry symbols Electrical and Electronic Engineering Eccentricity (mathematics) business Engineering (miscellaneous) |
| Zdroj: | Applied Optics. 58:5976 |
| ISSN: | 2155-3165 1559-128X |
| DOI: | 10.1364/ao.58.005976 |
| Popis: | In this work, we propose the construction of the Moiré-Ronchigram as a pattern obtained from simple Ronchigrams, superposed and with a slight degree of rotation, to obtain a 3D wavefront. The aberrations in the obtained wavefront are fitted to the aberration Zernike polynomial of degree 12 in order to obtain a polynomial expression of a high degree of efficiency, which is subsequently compared with the general equation of quadrics (considering the coefficients accordingly) to obtain essential parameters (as focus, eccentricity, or F number) that allow us to understand and manipulate the optical elements under test optimally. Finally, we compare our results analyzing optical surfaces to make a weak statistic of our proposed method. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|