| Autor: |
Gnedenkov, Sergey V., Sinebryukhov, Sergey L., Zheleznov, Veniamin V., Opra, Denis P., Voit, Elena I., Modin, Evgeny B., Sokolov, Alexander A., Ustinov, Alexander Yu., Sergienko, Valentin I. |
| Rok vydání: |
2018 |
| DOI: |
10.6084/m9.figshare.6287855.v1 |
| Popis: |
Figure S1: SEM image and elemental mapping of Ti, O, and Hf for Ti0.95Hf0.05O2; Figure S2: XPS high-resolution spectra of (a) Ti 2p, (b) O 1s, (c) Hf 4f, and (d) C 1s regions for Ti0.95Hf0.05O2 sample; Figure S3: Dependence of Z' on ω–1/2 at low frequencies; Table S1: Binding energy and atomic concentration of elements in Ti0.95Hf0.05O2 sample; Table S2: Dependence of Eg(1), B1g(1), and Eg(3) peaks positions on Hf/Ti atomic ratio |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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