Optical Properties Tuning of SnO2 Films by Metal Incorporation (Pt,Pd): Correlation with Microstructure Change

Autor: Mounir Gaidi, Michel Labeau, A. Hajjaji, Brahim Bessais, Brenard Chenevier, My Ali El Khakani
Přispěvatelé: Ecole Nationale des Sciences Appliquées, Université Chouaib Doukkali (UCD), Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Science et Ingénierie des Matériaux et Procédés (SIMaP), Université Joseph Fourier - Grenoble 1 (UJF)-Centre National de la Recherche Scientifique (CNRS)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Institut National Polytechnique de Grenoble (INPG)
Jazyk: angličtina
Rok vydání: 2009
Předmět:
Zdroj: Japanese Journal of Applied Physics
Japanese Journal of Applied Physics, Japan Society of Applied Physics, 2009, 48 (7), pp.072501. ⟨10.1143/jjap.48.072501⟩
ISSN: 0021-4922
DOI: 10.1143/jjap.48.072501⟩
Popis: International audience; In this work, we report on the effect of noble metal doping (namely Pd or Pt) on the optical properties of SnO2 thin films. The optical constants (n and k) of the films, as a function of noble metal nature and content, were obtained using variable angle spectroscopic ellipsometry in the ultraviolet-visible-near infrared (UV-vis-NIR) regions. Ellipsometry analysis showed that we can tune the optical constants of SnO2 films by changing Pt or Pd doping concentration. In particular, their refractive index increases from 1.6 to similar to 2 while varying Pt content from 3 to 12 at. %. The origin of this optical behaviour was correlated to the microstructure change induced by metal doping. X-ray diffraction (XRD) was used to investigate the effect of doping on SnO2 lattice parameter, on crystallite size and on film preferential orientation. Atomic force microscopy (AFM) was used to estimate the surface roughness of the films. A metal concentration of similar to 3 at.% (for both Pt and Pd), which is known to yield the highest SnO2 gas sensing response, was found to correspond to the highest contraction of the lattice parameter of the films. Finally, the energy band gap of undoped SnO2 thin films (estimated to 4 eV) was found to shift to lower value while increasing doping concentrations. (C) 2009 The Japan Society of Applied Physics DOI: 10.1143/JJAP.48.072501
Databáze: OpenAIRE