Short-range order in AgAl alloys studied by EXAFS spectroscopy
| Autor: | S.J. Gurman, F. Neissendorfer, W. Pfeiler, E. Zschech |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 1995 |
| Předmět: |
Exafs spectroscopy
Materials science Extended X-ray absorption fine structure Analytical chemistry Institut für Physik und Astronomie Condensed Matter Physics Electronic Optical and Magnetic Materials Characterization (materials science) symbols.namesake Fourier transform Absorption edge Electrical resistivity and conductivity Electron yield Short range order symbols Electrical and Electronic Engineering |
| Popis: | The influence of heat treatment on the short-range order (SRO) of Ag−15.5 at % Al alloys was studied by total electron yield (TEY) measurements. The EXAFS modulation was extracted from the experimental data above the AlK absorption edge and, subsequently, analysed on the basis of its Fourier transformation. An essential advantage of the EXAFS spectroscopy is the possibility to determine the SRO directly. The resulting information about the chemical SRO is in good correspondence with electrical resistivity measurements, an indirect method for SRO characterization with high accuracy. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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