Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

Autor:	Phillip J. Nigh, David P. Vallett, Donato O. Forlenza, J. Wright, W. Chong, A. Patel, Franco Motika, R. Kurtulik
Rok vydání:	2003
Předmět:	Boundary scan testing Engineering business.industry Logic testing Test method Electrical and Electronic Engineering Safety Risk Reliability and Quality Fault (power engineering) business Reliability (statistics) Iddq testing Test (assessment) Reliability engineering
Zdroj:	ITC
DOI:	10.1109/test.1999.805883
Popis:	SEMATECH has sponsored a "test method evaluation" study to understand the trade-offs among the most common test methodologies used in the industry. This paper presents the results of the failure analysis portion of that project. The testing, reliability stressing, characterization, fault diagnosis and physical analysis results are presented for 25 devices including "IDDq-only" failures and "delay test-only" failures.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::79d77f05f2ad67c6e7e06cc3fa01c9a9 https://doi.org/10.1109/test.1999.805883 Zobrazit plný text záznamu