Microstructural features and orientation correlations of non-modulated martensite in Ni-Mn-Ga epitaxial thin films
| Autor: | Yudong Zhang, Bin Yang, Xinfeng Zhao, Claude Esling, Zongbin Li, Gaowu Qin, O. Perroud, Liang Zuo |
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| Přispěvatelé: | Northeastern University [Shenyang], Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3), Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)-Arts et Métiers Sciences et Technologies, HESAM Université (HESAM)-HESAM Université (HESAM), Labex DAMAS, Université de Lorraine (UL), ANR-11-LABX-0008,DAMAS,Design des Alliages Métalliques pour Allègement des Structures(2011) |
| Jazyk: | angličtina |
| Rok vydání: | 2013 |
| Předmět: |
Materials science
Polymers and Plastics Crystallographic features 02 engineering and technology Substrate (electronics) 01 natural sciences Tetragonal crystal system [SPI]Engineering Sciences [physics] 0103 physical sciences Lamellar structure Surface layer Thin film Composite material 010302 applied physics Ferromagnetic shape memory alloys Metals and Alloys Ni-Mn-Ga thin films [CHIM.MATE]Chemical Sciences/Material chemistry Sputter deposition 021001 nanoscience & nanotechnology Electronic Optical and Magnetic Materials Crystallography Electron backscatter diffraction Ceramics and Composites 0210 nano-technology Layer (electronics) |
| Zdroj: | Acta Materialia Acta Materialia, Elsevier, 2013, 61 (18), pp.6809-6820. ⟨10.1016/j.actamat.2013.07.055⟩ |
| ISSN: | 1359-6454 |
| DOI: | 10.1016/j.actamat.2013.07.055⟩ |
| Popis: | International audience; Epitaxially grown thin films with nominal composition Ni50Mn30Ga20 and thickness 1.5 mu m were prepared on MgO(1 0 0) substrate with a Cr buffer layer by DC magnetron sputtering. The surface layer microstructures of the as-deposited thin films consist of non-modulated (NM) martensite plates with tetragonal structure at ambient temperature, which can be classified into the low and high relative contrast zones of clustered plates (i.e. plate colonies) with parallel or near-parallel inter-plate interface traces in secondary electron images. Orientation analyses by electron backscatter diffraction revealed that individual NM plates are composed of alternately distributed thicker and thinner lamellar variants with (1 1 2)(Tetr) compound twin relationship and coherent interlamellar interfaces. In each plate colony, there are four distinct plates in terms of the crystallographic orientation of the thicker lamellar variants and therefore, in total, eight orientation variants. For the low relative contrast zones, both thicker and thinner lamellar variants in adjacent plates are distributed symmetrically across their inter-plate interfaces (along the substrate edges). At the atomic level, there are no unbalanced interfacial misfits and height misfits, resulting in long and straight inter-plate interfaces with homogeneous contrast. However, in the high relative contrast zones, the thicker and thinner lamellar variants in adjacent plates are oriented asymmetrically across their inter-plate interfaces (at similar to 45 degrees to the substrate edges). Significant atomic misfits appear in the vicinity of the inter-plate interfaces and in the film normal direction. The former result in bending of the inter-plate interfaces, and the latter give rise to the high relative contrast between adjacent plates. |
| Databáze: | OpenAIRE |
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