Supplementary document for Electric-field-resolved near infrared microscopy - 5824716.pdf

Autor: Mamaikin, Mikhail, Li, Yik-Long, Ridente, Enrico, Chen, Wei-Ting, Park, Joon-Suh, Zhu, Alexander, Capasso, Federico, Weidman, Matthew, Schulze, Martin, Krausz, Ferenc
Rok vydání: 2022
Předmět:
DOI: 10.6084/m9.figshare.19735516.v1
Popis: Supplemental information document
Databáze: OpenAIRE