Analysis by Finite Element Calculations of Light Scattering in Laser-textured AZO Films for PV thin-film Solar Cells
| Autor: | D. Canteli, Joan Bertomeu, S. Lauzurica, Carlos Molpeceres, M. Lluscà, Miguel Morales, Josefa Maria Ramal Lopez, M.I. Sánchez-Aniorte |
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| Přispěvatelé: | Universitat de Barcelona, Canteli, D, Lopez, JM, Lauzurica, S, Lluscá, M, Sánchez-Aniorte, MI, Bertomeu, J, Morales, M, Molpeceres, C |
| Jazyk: | angličtina |
| Rok vydání: | 2015 |
| Předmět: |
Solar cells
Dispersió de la llum Finite element method Materials science Energy & Fuels laser texturing Thin films Laser texturing Materials Science Multidisciplinary Mètode dels elements finits 02 engineering and technology Surface finish 7. Clean energy 01 natural sciences finite element method simulations Light scattering law.invention Root mean square Optics Energy(all) law 0103 physical sciences Texture (crystalline) light management finite element method (FEM) simulations 010302 applied physics Pel·lícules fines FEM business.industry Scattering Física 021001 nanoscience & nanotechnology Laser Isotropic etching Light intensity Electrónica Cèl·lules solars 0210 nano-technology business Mecánica |
| Zdroj: | Recercat. Dipósit de la Recerca de Catalunya instname Dipòsit Digital de la UB Universidad de Barcelona Energy Procedia, ISSN 1876-6102, 2015, No. 84 Archivo Digital UPM Universidad Politécnica de Madrid |
| Popis: | In the thin-film photovoltaic industry, to achieve a high light scattering in one or more of the cell interfaces is one of the strategies that allow an enhancement of light absorption inside the cell and, therefore, a better device behavior and efficiency. Although chemical etching is the standard method to texture surfaces for that scattering improvement, laser light has shown as a new way for texturizing different materials, maintaining a good control of the final topography with a unique, clean, and quite precise process. In this work AZO films with different texture parameters are fabricated. The typical parameters used to characterize them, as the root mean square roughness or the haze factor, are discussed and, for deeper understanding of the scattering mechanisms, the light behavior in the films is simulated using a finite element method code. This method gives information about the light intensity in each point of the system, allowing the precise characterization of the scattering behavior near the film surface, and it can be used as well to calculate a simulated haze factor that can be compared with experimental measurements. A discussion of the validation of the numerical code, based in a comprehensive comparison with experimental data is included. Refereed/Peer-reviewed |
| Databáze: | OpenAIRE |
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