The Beam Current Considerations in SEM Accordance to Mirror Effect Phenomenon

Autor:	Hassan N. Al-Obaidi, Imad H. Khaleel
Rok vydání:	2013
Předmět:	Conventional transmission electron microscope Physics Optics business.industry Scanning electron microscope Scanning transmission electron microscopy Electron Electric potential Electron beam-induced deposition business Environmental scanning electron microscope Beam (structure)
Zdroj:	International Letters of Chemistry, Physics and Astronomy. 15:70-75
ISSN:	2299-3843
DOI:	10.18052/www.scipress.com/ilcpa.15.70
Popis:	A theoretical investigation have been presented to exploring the influence of electrons beam current on the electron mirror image deduced inside the scanning electron microscope (SEM). A rough mathematical expression for the electric potential that associated with electron beam is derived. The results clearly shows that the beam current could be used to enhance or conversely deteriorate the phenomena of mirror effect. So this work procedure may consider to be tool controllable of this phenomena for investigation purposes.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::77bd1360ae002b4d052eb7e366dadcdb https://doi.org/10.18052/www.scipress.com/ilcpa.15.70 Zobrazit plný text záznamu