Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs
| Autor: | Sophie Dupuis, H. El Badawi, Laurent Latorre, Mariane Comte, Bruno Rouzeyre, T. Vayssadel, Arnaud Virazel, Marie-Lise Flottes, François Lefèvre, Vincent Kerzérho, Florence Azaïs, Emanuele Valea, Patrick Girard, B. Deveautour, Serge Bernard |
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| Přispěvatelé: | TEST (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Smart Integrated Electronic Systems (SmartIES), NXP Semiconductors |
| Rok vydání: | 2020 |
| Předmět: |
Computer science
AxC 02 engineering and technology Machine Learning Factor (programming language) 0202 electrical engineering electronic engineering information engineering Production (economics) [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Reliability (statistics) computer.programming_language Focus (computing) business.industry Node (networking) 020208 electrical & electronic engineering Fault tolerance Security and test Chip 020202 computer hardware & architecture Test (assessment) ETI Embedded system RF testing business Scan encryption computer |
| Zdroj: | IOLTS 26th International Symposium on Testing and Robust System Design (IOLTS) Testing and Robust System Design (IOLTS), Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩ |
| Popis: | International audience; Systems on a chip have seen their surface area increased by a factor of 10 and their consumption multiplied by 5 during the last ten years. Each technological node that enabled this integration has also added new constraints challenging the overall system reliability. In addition, the integration of analog/RF blocks adds specific issues, in particular the high cost of the required test equipment. It is therefore necessary to improve test and reliability solutions in order to guarantee the production yield and the system lifetime. Moreover, the massive increase in the use of communicating systems has introduced security as a cornerstone of their development. The entire hardware production flow is therefore subject to security and trust issues requiring the development of dedicated test solutions. In this paper, we focus on LIRMM contributions in the HADES project especially with details on Embedded Test Instruments (ETIs) for reliability of digital ICs, low-cost RF test based on indirect DC measurements or digital ATE capture, management of secure scan access. |
| Databáze: | OpenAIRE |
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