Resonant Inelastic X-Ray Scattering from Valence Excitations in Insulating Copper Oxides
| Autor: | L. L. Miller, S-W. Cheong, Peter Abbamonte, Miles V. Klein, E. D. Isaacs, P. M. Platzman, Clement Burns |
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| Rok vydání: | 1999 |
| Předmět: |
Valence (chemistry)
Materials science Strongly Correlated Electrons (cond-mat.str-el) FOS: Physical sciences General Physics and Astronomy Resonance 02 engineering and technology Electronic structure Inelastic scattering 021001 nanoscience & nanotechnology 01 natural sciences 7. Clean energy Spectral line Resonant inelastic X-ray scattering Condensed Matter - Strongly Correlated Electrons Absorption edge Excited state 0103 physical sciences Atomic physics 010306 general physics 0210 nano-technology |
| Zdroj: | Physical Review Letters. 83:860-863 |
| ISSN: | 1079-7114 0031-9007 |
| DOI: | 10.1103/physrevlett.83.860 |
| Popis: | We report resonant inelastic x-ray measurements of insulating La$_2$CuO$_4$ and Sr$_2$CuO$_2$Cl$_2$ taken with the incident energy tuned near the Cu K absorption edge. We show that the spectra are well described in a shakeup picture in 3rd order perturbation theory which exhibits both incoming and outgoing resonances, and demonstrate how to extract a spectral function from the raw data. We conclude by showing {\bf q}-dependent measurements of the charge transfer gap. Comment: minor notational changes, discussion of anderson impurity model fixed, references added; accepted by PRL |
| Databáze: | OpenAIRE |
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