Electric Field Intensity Modulated Scattering as a Thin-Film Depth Probe
| Autor: | Adam Z. Weber, Peter Dudenas, Ahmet Kusoglu |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
Nanostructure
Materials science FOS: Physical sciences 02 engineering and technology Applied Physics (physics.app-ph) Condensed Matter - Soft Condensed Matter 010402 general chemistry 01 natural sciences General Biochemistry Genetics and Molecular Biology Optics Electric field Thin film Born approximation Scattering business.industry Resolution (electron density) Physics - Applied Physics 021001 nanoscience & nanotechnology 0104 chemical sciences Beamline Soft Condensed Matter (cond-mat.soft) 0210 nano-technology business Refractive index Optics (physics.optics) Physics - Optics |
| Popis: | Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films that possess stratification of scatterers vertically within a sample, it can be difficult to determine where those scatterers are positioned. We present an in-situ method to extract film thickness, the index of refraction, and depth information using scattering images taken across a range of incident angles. The underlying theory is presented, and we validate the technique using two sets of polymer thin films. Finally, we discuss how it can be implemented as a general beamline procedure. This technique is applicable to any thin-film material and has potentially far-reaching impact by enabling depth-sensitive information in situ at any grazing incidence-capable beamline. 8 pages, 8 figures Revision Comments: The title has been changed to reflect the expanded scope of the revised manuscript. Theoretical background for the technique has been expanded. Data analysis for the single layer films was re-done, using updated beam divergence and energy resolution values. Finally, an additional section on bi-layer films has been added |
| Databáze: | OpenAIRE |
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