Systematic study of the cross polarization introduced by broadband antireflection layers at microwave frequencies
Autor: | Leonardo Bronfman, Pavel A. Yagoubov, V. Tapia, Nicolas Reyes, F. Cuttaia, F. Patricio Mena, Rafael Rodriguez |
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Přispěvatelé: | Electromagnetics, ITA, DEU, CHL, JPN |
Jazyk: | angličtina |
Rok vydání: | 2018 |
Předmět: |
Materials science
business.industry Physics::Optics 020206 networking & telecommunications 02 engineering and technology Polarization (waves) 01 natural sciences Atomic and Molecular Physics and Optics 010309 optics Radio telescope symbols.namesake Fourier transform Optics Electric field 0103 physical sciences Broadband 0202 electrical engineering electronic engineering information engineering symbols Millimeter Electrical and Electronic Engineering business Engineering (miscellaneous) Refractive index Microwave |
Zdroj: | Applied Optics, 57(31), 9223-9229. Optical Society of America (OSA) |
ISSN: | 2155-3165 0003-6935 1559-128X |
DOI: | 10.1364/AO.57.009223 |
Popis: | Implementation of antireflection layers using structured materials is of common use in millimeter-and submillimeter-wave refractive optic systems. In this work we have systematically studied the effect of such structures in the optical propagation with special emphasis on the cross polarization they introduce. We have performed extensive simulations and experimental verification of several commonly used structures: concentric grooves, parallel grooves, an array of boxes, an array of cylinders, and rectangular-versus triangular-shaped grooves. As a result, we propose optimal structures for demanding applications in terms of polarization and return losses over large fractional bandwidths. |
Databáze: | OpenAIRE |
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