Impact parameter dependent electron capture by decelerated U 91+ ions at 20 MeV/u using crystal channeling conditions
| Autor: | P. H. Mokler, Cédric Ray, M. Tarisien, Th. Stöhlker, A. L'Hoir, R. Kirsch, Etienne Testa, Marius Chevallier, Christophor Kozhuharov, Denis Dauvergne, F. Bosch, A. Gumberidze, A. Bräuning-Demian, S. Toleikis, Marcel Toulemonde, J.-C. Poizat, H. Bräuning, C. Cohen, Dieter Liesen |
|---|---|
| Přispěvatelé: | Institut de Physique Nucléaire de Lyon (IPNL), Centre National de la Recherche Scientifique (CNRS)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3), CAS-PHABIO, Université de Lyon-Université de Lyon-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)-Université Claude Bernard Lyon 1 (UCBL), Flores, Sylvie |
| Rok vydání: | 2003 |
| Předmět: |
Nuclear and High Energy Physics
[PHYS.PHYS.PHYS-ATOM-PH]Physics [physics]/Physics [physics]/Atomic Physics [physics.atom-ph] Silicon Chemistry Electron capture chemistry.chemical_element 7. Clean energy 01 natural sciences Secondary electrons 010305 fluids & plasmas Ion Core electron Ionization Excited state 0103 physical sciences [PHYS.PHYS.PHYS-ATOM-PH] Physics [physics]/Physics [physics]/Atomic Physics [physics.atom-ph] Impact parameter Atomic physics 010306 general physics Instrumentation |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Nuclear Instruments and Methods in Physics Research B International Conference on Highly Charged Ions International Conference on Highly Charged Ions, Sep 2002, Caen, France. pp.773 |
| ISSN: | 0168-583X |
| DOI: | 10.1016/s0168-583x(03)00541-x |
| Popis: | We present results of an experiment using decelerated U91+ ions, extracted from the GSI-ESR storage ring, and transmitted through a thin silicon crystal in channeling conditions. Charge state at emergence, secondary electron multiplicity and X-rays are measured simultaneously. These conditions allow to study the competition between mechanical electron capture (MEC) and radiative electron capture (REC) as a function of impact parameter. We observe that REC is the dominant charge exchange process for the best channeled ions, i.e. those travelling always far from the silicon target core electrons. For ions with high transverse energy, MEC into highly excited states is counterbalanced by enhanced ionization arising from a succession of close collisions along atomic rows. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect