Dual behavior or coexistence of trapped and free states in reducible rutile Ti O 2
| Autor: | Stéphane Chenot, Rémi Lazzari, Jacques Jupille, Jingfeng Li |
|---|---|
| Přispěvatelé: | Institut des Nanosciences de Paris (INSP), Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), Oxydes en basses dimensions (INSP-E9), Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Materials science
Condensed matter physics Phonon Polarons Carrier dynamics Charge (physics) 02 engineering and technology Electron Dielectric 021001 nanoscience & nanotechnology 01 natural sciences 7. Clean energy Condensed Matter::Materials Science Surface states Rutile Dielectric properties 0103 physical sciences Charge carrier Point defects Adsorption [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat] 010306 general physics 0210 nano-technology Spectroscopy Intensity (heat transfer) |
| Zdroj: | Physical Review B Physical Review B, American Physical Society, 2020, 102 (8), ⟨10.1103/PhysRevB.102.081401⟩ |
| ISSN: | 2469-9950 2469-9969 |
| Popis: | Excess electron transport is explored at the reduced $\mathrm{Ti}{\mathrm{O}}_{2}$(110) rutile surface through high-resolution electron energy-loss spectroscopy. Changes in line shape, intensity, and energy position of elastic and phonon peaks are associated to changes in charge-carrier and band-gap state excitations. The dielectric modeling points to a defined inward charge profile and to distinct bulk and surface transport properties. The one-to-one correlation between band-gap state intensity and carrier density favors a dual polaronic behavior of charge carriers over the coexistence of trapped and free states. |
| Databáze: | OpenAIRE |
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