High nitrogen composition–induced low interfacial roughness of GaAs 0.978 N 0.022 /GaAs multiple quantum wells grown through solid-source molecular beam epitaxy

Autor: Subhananda Chakrabarti, Anuj Bhatnagar, Binita Tongbram, Mahitosh Biswas, Nilesh Shinde, Roshan Makkar
Rok vydání: 2017
Předmět:
Zdroj: Materials Research Bulletin. 88:242-247
ISSN: 0025-5408
Popis: GaAs1-xNx/GaAs multiple quantum wells (MQWs) were grown on GaAs(001) substrates through solid source molecular beam epitaxy under various nitrogen background pressures (NBPs), and the crystal quality at the interface of GaAs1-xNx and GaAs was investigated. X-ray diffraction and electron microscopy confirmed the low interface roughness of MQWs grown at a NBP of 5 x 10(-6) Torr. Surface morphology measurements revealed a smooth surface without whisker-like defect structures. The fabricated MQWs exhibited high photoluminescence intensity because of the reduction in surface recombination with high nitrogen incorporation. Raman spectroscopy confirmed the presence of N-like local vibrational mode, and this was attributed to the presence of phase separation in GaAsN alloys. Rapid thermal annealing improved photoluminescence intensity by 100-fold and substantially reduced full width at half maximum because of MQW homogenization. These results evidence the favorable crystal interface of GaAs0.978Na0.022 alloys. Hence, GaAs0.978N0.022/GaAs MQWs grown under high pressure might be useful in fabricating optoelectronic devices. (C) 2016 Published by Elsevier Ltd.
Databáze: OpenAIRE