| Autor: |
C. Kiener, A. C. Maciel, Denis Martin, J. M. Freyland, F. K. Reinhart, J. F. Ryan, Lucio Rota, U. Marti, K. Turner, F. Morier-Gemoud |
| Rok vydání: |
2016 |
| Předmět: |
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| Zdroj: |
Hot Carriers in Semiconductors ISBN: 9781461380351 |
| Popis: |
Trapping into the active region is one of the most important design considerations in quantum well lasers. This process becomes crucial for the operation of quantum wire devices since the very small active volume demands strong coupling to the external region, otherwise trapping is greatly inhibited. We report the first measurements of electron trapping from extended three-dimensional (3D) states into one-dimensional (ID) states of a semiconductor quantum wire structure. Our joint theoretical and experimental investigation shows that the trapping time is extremely fast, ~10 ps. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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