The production of heavy multiply charged ions in secondary ion mass spectrometry
| Autor: | James B. Metson, D.L. Tui, P. A. W. van der Heide, W. M. Lau |
|---|---|
| Rok vydání: | 1993 |
| Předmět: |
education.field_of_study
Ion beam Chemistry Population Analytical chemistry Surfaces and Interfaces Condensed Matter Physics Secondary electrons Surfaces Coatings and Films Ion Secondary ion mass spectrometry Metal Physics::Plasma Physics Ionization visual_art Materials Chemistry visual_art.visual_art_medium Irradiation education |
| Zdroj: | Surface Science. 280:208-216 |
| ISSN: | 0039-6028 |
| Popis: | In this study it was found that the multiply charged ion emissions (M2+ and M3+) of Al, Au, Ag, Cd, Co, Cu, Hg, In, Mo, Sc, Te, Ta, and V, arising from O− bombardment of metal surfaces, exhibited a great variety of energy distributions. This is attributed to the competing surface and gas phase ionization mechanisms. Investigations of the gas phase collision process were carried out by studying the primary ion current density effects on the intensities of Aln+, Agn+, Cdn+, and Inn+, (n = 1, 2, 3), t fractionation exhibited by energy deficient Cu2+ ions, and the image displacement of multiply charged ions with respect to intrinsically formed singly charged ions. These revealed that both doubly and triply charged ions from the heavier elements are formed predominantly from gas phase collisions between the secondary neutral population and the secondary electron, or primary ion population, during single primary ion events. A kinematics study however, discounted the possibility of primary ion interaction, whether surface scattered or not. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|