Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study
| Autor: | M. X. Tang, J. W. Huang, J. C. E, Y. Y. Zhang, S. N. Luo |
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| Rok vydání: | 2020 |
| Předmět: |
Diffraction
Nuclear and High Energy Physics Digital image correlation Radiation Materials science Strain (chemistry) Infinitesimal strain theory Synchrotron radiation 02 engineering and technology 021001 nanoscience & nanotechnology Research Papers 01 natural sciences Computational physics Stress (mechanics) Condensed Matter::Materials Science Dynamic loading 0103 physical sciences X-ray crystallography 010306 general physics 0210 nano-technology Instrumentation |
| Zdroj: | J Synchrotron Radiat |
| ISSN: | 1600-5775 |
| DOI: | 10.1107/s1600577520003926 |
| Popis: | Strain tensor measurements are important for understanding elastic and plastic deformation, but full bulk strain tensor measurement techniques are still lacking, in particular for dynamic loading. Here, such a methodology is reported, combining imaging-based strain field mapping and simultaneous X-ray diffraction for four typical loading modes: one-dimensional strain/stress compression/tension. Strain field mapping resolves two in-plane principal strains, and X-ray diffraction analysis yields volumetric strain, and thus the out-of-plane principal strain. This methodology is validated against direct molecular dynamics simulations on nanocrystalline tantalum. This methodology can be implemented with simultaneous X-ray diffraction and digital image correlation in synchrotron radiation or free-electron laser experiments. |
| Databáze: | OpenAIRE |
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