Laser ablation of Ga-Sb-Te thin films monitored with quadrupole ion trap time-of-flight mass spectrometry
| Autor: | Govinda Mandal, Josef Havel, Petr Němec, Magdaléna Gorylová, Virginie Nazabal |
|---|---|
| Přispěvatelé: | Masaryk University [Brno] (MUNI), University of Pardubice, Synthèse Caractérisation Analyse de la Matière (ScanMAT), Centre National de la Recherche Scientifique (CNRS)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Institut de Chimie du CNRS (INC), Institut des Sciences Chimiques de Rennes (ISCR), Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA), Analytical and Physical and Chemical Methods for Geological, Biological and Synthetic Materials [MUNI/A/1421/2019], Czech Science Foundation Grant Agency of the Czech Republic [19-24516S], Université de Rennes (UR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Materials science
Analytical chemistry amorphous chalcogenides 02 engineering and technology Mass spectrometry Ga-Sb-Te 01 natural sciences 0103 physical sciences Materials Chemistry [CHIM]Chemical Sciences clusters Thin film Quadrupole ion trap 010302 applied physics Thin layers Laser ablation [CHIM.MATE]Chemical Sciences/Material chemistry 021001 nanoscience & nanotechnology thin films quadrupole ion trap time-of-flight mass spectrometry Ceramics and Composites Mass spectrum laser ablation Time-of-flight mass spectrometry 0210 nano-technology diminishing clusters fragmentation Stoichiometry |
| Zdroj: | Journal of the American Ceramic Society Journal of the American Ceramic Society, Wiley, 2021, ⟨10.1111/jace.18021⟩ Journal of the American Ceramic Society, 2021, 104 (12), pp.6643-6652. ⟨10.1111/jace.18021⟩ |
| ISSN: | 0002-7820 1551-2916 |
| Popis: | International audience; Laser ablation of Ga-Sb-Te chalcogenide thin films prepared by radiofrequency magnetron co-sputtering was monitored with quadrupole ion trap time-of-flight mass spectrometry (QIT-TOF-MS). The mass spectra of 11 thin films of various compositions (Ga: 0-53.1, Sb: 0-52.0, and Te: 0-100.0 at. %) were recorded. Several series of unary (Ga-x, Sb-y, and Te-z) binary (GaxSby, GaxTez, and SbyTez), and ternary GaxSbyTez clusters were identified in both positive and negative ion modes. Stoichiometry of observed clusters was determined. Up to 18 binary clusters (positively and negatively charged) were detected for thin film with low Sb content of 6.5 at. %. The highest number (4) of ternary clusters was observed for thin film with high Te content of 66.7 at. %. The number of generated clusters and their peaks intensity varied according to the chemical composition of thin films. Altogether, 41 clusters were detected. The laser ablation monitoring shows laser-induced fragmentation of thin film structure. The relation of clusters stoichiometries to the chemical composition of thin films is discussed. The fragmentation can be diminished by covering a surface of thin films with paraffin's, glycerol, or trehalose sugar thin layers. The stoichiometry of generated clusters shows partial structural characterization of thin films. |
| Databáze: | OpenAIRE |
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