Measurements and Characterisation of Surface Scattering at 60 GHz
| Autor: | Mark Beach, Alberto Loaiza Freire, Evangelos Mellios, Thomas H. Barratt, Peter Cain, Moray Rumney, Andrew Nix, Angelos A. Goulianos |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: |
Signal Processing (eess.SP)
Materials science business.industry Scattering 020206 networking & telecommunications 020302 automobile design & engineering 02 engineering and technology Surface finish Characterization (materials science) Optics 0203 mechanical engineering Angle of incidence (optics) 0202 electrical engineering electronic engineering information engineering Reflection (physics) Surface roughness FOS: Electrical engineering electronic engineering information engineering Fading Specular reflection Electrical Engineering and Systems Science - Signal Processing business |
| Zdroj: | VTC-Fall |
| Popis: | This paper presents the analysis and characterization of the surface scattering process for both specular and diffused components. The study is focused on the investigation of various building materials each having a different roughness, at a central frequency of 60GHz. Very large signal strength variations in first order scattered components is observed as the user moves over very short distances. This is due to the small-scale fading caused by rough surface scatterers. Furthermore, it is shown that the diffused scattering depends on the material roughness, the angle of incidence and the distance from the surface. Finally, results indicate that reflections from rough materials may suffer from high depolarization, a phenomenon that can potentially be exploited in order to improve the performance of mm-Wave systems using polarization diversity. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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