High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths
| Autor: | Jing-Lun Lin, Railing Chang, Sheng-Yu Su, Hai-Pang Chiang, P.T. Leung |
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| Rok vydání: | 2005 |
| Předmět: |
Materials science
business.industry Surface plasmon Phase (waves) Physics::Optics Information Storage and Retrieval Reproducibility of Results Equipment Design Surface Plasmon Resonance Image Enhancement Sensitivity and Specificity Atomic and Molecular Physics and Optics Equipment Failure Analysis Wavelength Motion Optics Interferometry Image Interpretation Computer-Assisted Angular resolution Surface plasmon resonance business Image resolution Order of magnitude Excitation Algorithms |
| Zdroj: | Optics letters. 30(20) |
| ISSN: | 0146-9592 |
| Popis: | It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9 x 10(-6) deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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