Microstructural characterization of medium entropy alloy thin films
| Autor: | Jakub Zalesak, Megan J. Cordill, Robert Franz, Niraj Chawake, Jeong Tae Kim, Jürgen Eckert, Christoph Gammer |
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| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Materials science Mechanical Engineering High entropy alloys Bilayer Alloy Metals and Alloys 02 engineering and technology engineering.material Sputter deposition 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Characterization (materials science) Planar Transmission electron microscopy Mechanics of Materials 0103 physical sciences Cavity magnetron engineering Entropy (information theory) General Materials Science Composite material Thin film 0210 nano-technology |
| Zdroj: | Scripta Materialia. 177:22-26 |
| ISSN: | 1359-6462 |
| Popis: | This study presents detailed microstructural investigations on single and bilayer thin films of two medium entropy alloys (MEAs) synthesized using magnetron sputter deposition. Single layer thin films of CoCrFeNi and AlCoCrFe show single-phase face-centered cubic (fcc) and body-centered (bcc) structure, respectively. The bilayer thin film consisting of CoCrFeNi (fcc) and AlCoCrFe (bcc) has a sharp interface between them with an equiatomic composition. Nanodiffraction was used to characterize planar defects in the fcc films. Plausibly, this maiden study on bilayer film of two MEAs is transformative to other systems and will help fundamental studies on high entropy alloys. |
| Databáze: | OpenAIRE |
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