Identification of nanoscale structure and morphology reconstruction in oxidized a-SiC:H thin films
| Autor: | V. S. Lysenko, Sergii Starik, A.V. Rusavsky, Petro M. Lytvyn, Vitaly Bondarenko, Alexei Nazarov, A. V. Vasin, Konstantin Kholostov, V. V. Strelchuk |
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| Rok vydání: | 2012 |
| Předmět: |
Kelvin probe force microscope
Materials science oxidation Scanning electron microscope amorphous silicon carbide kelvin probe force microscopy Analytical chemistry General Physics and Astronomy Surfaces and Interfaces General Chemistry Thermal treatment Sputter deposition Condensed Matter Physics Surfaces Coatings and Films Microscopy Thin film Spectroscopy Layer (electronics) |
| Zdroj: | Applied Surface Science. 260:73-76 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/j.apsusc.2012.04.016 |
| Popis: | Oxidation behavior of a-SiC:H layers deposited by radio-frequency magnetron sputtering technique was examined by Kelvin probe force microscopy (KPFM) in combination with scanning electron microscopy, Fourier-transform infra-red spectroscopy and submicron selected area Raman scattering spectroscopy. Partially oxidized a-SiC:H samples (oxidation at 600 °C in oxygen) were examined to clarify mechanism of the oxidation process. Nanoscale and microscale morphological defects (pits) with dimension of about 50 nm and several microns respectively have appeared after thermal treatment. KPFM measurements exhibited the surface potential of the material in micro pits is significantly smaller in comparison with surrounding material. Submicron RS measurements indicates formation of graphite-like nano-inclusions in the pit defects. We conclude that initial stage of oxidation process in a-SiC:H films takes place not homogeneously throughout the layer but it is initiated in local nanoscale regions followed by spreading over all layer. |
| Databáze: | OpenAIRE |
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