MEASUREMENT OF HALF-VALUE LAYER IN COMPUTED TOMOGRAPHY SCANNERS USING LUMINESCENCE OF POLYETHERSULFONE RESIN BY X-RAY IRRADIATION
| Autor: | Chiyo Yamauchi-Kawaura, E Maki, Masataka Komori, Keisuke Fujii, Kuniharu Imai |
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| Rok vydání: | 2021 |
| Předmět: |
Radiation
Materials science Luminescence Tomography Scanners X-Ray Computed Radiological and Ultrasound Technology Phantoms Imaging Polymers Attenuation X-Rays Public Health Environmental and Occupational Health Analytical chemistry General Medicine Luminance Imaging phantom chemistry.chemical_compound chemistry Dosimetry Radiology Nuclear Medicine and imaging Irradiation Sulfones Methyl methacrylate Tomography X-Ray Computed Half-value layer |
| Zdroj: | Radiation protection dosimetry. 196(1-2) |
| ISSN: | 1742-3406 |
| Popis: | In this study, a method for estimating the half-value layer (HVL) and effective energy (Eeff) by imaging the luminescence from a polyethersulfone (PES) resin with rotating irradiation of X-rays in a computed tomography scanner was developed. The luminescence of the PES resin was imaged using a charge-coupled device camera. The PES-HVL was determined from the luminance attenuation profile corresponding to the X-ray attenuation within the resin. The PES-HVLs for tube potentials of 80–135 kVp were converted into Eeff values and were compared to those of a conventional lead-covered case method. The Eeff obtained using the proposed luminescence imaging method agreed within ~3.9% of that obtained using the conventional method. Moreover, dose simulations based on the X-ray spectrum calculated from the HVLs were performed using a poly(methyl methacrylate) phantom with a diameter of 16 cm. The simulated doses based on the luminescence imaging method agreed with the in-phantom dosimetry within ~9%. |
| Databáze: | OpenAIRE |
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