Predicting Lifetime of Semiconductor Power Devices under Power Cycling Stress using Artificial Neural Network

Autor:	Alessandro Vaccaro, Paolo Magnone, Andrea Zilio, Paolo Mattavelli
Jazyk:	angličtina
Rok vydání:	2022
Předmět:	Artificial Neural Network Neurons Thermal Cycling Artificial neural networks Semiconductor Power Devices Data models Energy Engineering and Power Technology Reliability Stress IGBT Power Cycling Power electronics Training Electrical and Electronic Engineering
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6c4a67a93d245b17f0f77f8f3a155389 https://hdl.handle.net/11577/3479965 Zobrazit plný text záznamu